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L&T Semiconductor Technologies (LTSCT) in Bengaluru is advancing Design for Testability (DFT) engineering for semiconductor chips. Key techniques include Memory Built-In Self-Test (MBIST), compressor-based scan chain insertion, and Boundary Scan compliant with IEEE standards.

The organization also focuses on Logic Built-In Self-Test (BIST), Analog BIST for specific blocks, and IO Built-In Self-Test methods. DFT simulations are conducted to ensure test coverage and quality, while debugging and resolution of DFT issues are integral to the design process.