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Northrop Grumman Develops Compact Testing for Radiation-Hardened Microelectronics

DEFENSE

Northrop Grumman has developed a compact testing environment for radiation-hardened microelectronics as part of DARPA's ASSERT program, significantly reducing testing time from years to months. This innovative technology, created in collaboration with Vanderbilt University and the Lawrence Berkeley National Laboratory, simulates extreme radiation conditions and enhances capabilities for space and nuclear applications, ultimately supporting the American supply chain for defense and commercial systems.

Northrop Grumman Develops Compact Testing for Radiation-Hardened Microelectronics
Jan 15, 2026, 6:16 AM

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